Fault Detection and Diagnosis
نویسندگان
چکیده
This paper describes about the ability of a system to detect the fault and diagnose of the test board by using generic logic array (GAL). It has been very popular in defense sectors like military systems, aerospace and medical instruments as well as in security and safety applications. The methodology used in this is “repair on the go” which detects the fault IC on the board that is under the test, then that fault IC is controlled by one of the columns of GAL. The fault pin of that IC can be visualized using a seven segment display and audio representation with the help of a buzzer. This method increases the life line of the system and this methodology can also be implemented using FPGA’s. Figure 1: Block Diagram
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